(oral talk) Comparison of boron-oxygen and copper-related light-induced degradation in silicon

Research output: Contribution to conference › Abstract › Scientific › peer-review

Original language	English
Publication status	Published - 2015
MoE publication type	Not Eligible
Event	Conference on Gettering and Defect Engineering in Semiconductor Technology - Bad Staffelstein, Germany Duration: 20 Sept 2015 → 25 Sept 2015 Conference number: 16

Conference	Conference on Gettering and Defect Engineering in Semiconductor Technology
Abbreviated title	GADEST
Country/Territory	Germany
City	Bad Staffelstein
Period	20/09/2015 → 25/09/2015

Cite this

@conference{7c5984fe4c4f4c009ce2d13def95dedc,

title = "(oral talk) Comparison of boron-oxygen and copper-related light-induced degradation in silicon",

author = "Jeanette Lindroos and Hele Savin",

year = "2015",

language = "English",

note = "Conference on Gettering and Defect Engineering in Semiconductor Technology , GADEST ; Conference date: 20-09-2015 Through 25-09-2015",

}