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(oral talk) Analysis of the Atomic Layer Deposited Al2O3 field-effect passivation in black silicon

  • Guillaume von Gastrow
  • , Ramon Alcubilla
  • , Pablo Ortega
  • , Marko Yli-Koski
  • , Sònia Conesa-Boj
  • , Anna Fontcuberta i Morral
  • , Hele Savin
  • Polytechnic University of Catalonia
  • Swiss Federal Institute of Technology Lausanne

Research output: Contribution to conferenceAbstractScientificpeer-review

Original languageEnglish
Publication statusPublished - 2015
MoE publication typeNot Eligible
EventInternational Conference on Crystalline Silicon Photovoltaics - Konstanz, Germany
Duration: 23 Mar 201525 Mar 2015
Conference number: 5

Conference

ConferenceInternational Conference on Crystalline Silicon Photovoltaics
Abbreviated titleSiliconPV
Country/TerritoryGermany
CityKonstanz
Period23/03/201525/03/2015

Keywords

  • Al2O3
  • atomic layer deposition
  • nano-texturing
  • negative charge
  • reactive ion etching
  • surface passivation

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