Optimal signed rank tests in symmetric IC models

Pauliina Ilmonen, Davy Paindaveine

Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

Original languageEnglish
Title of host publicationProceedings of 17th European Young Statisticians Meeting (EYSM)
Pages115-120
Publication statusPublished - 2011
MoE publication typeA4 Article in a conference publication
EventEuropean Young Statisticians Meeting - Lisbon, Portugal
Duration: 5 Sep 20119 Sep 2011
Conference number: 17

Conference

ConferenceEuropean Young Statisticians Meeting
Abbreviated titleEYSM
CountryPortugal
CityLisbon
Period05/09/201109/09/2011

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