Optical Temperature Measurement Method for Glowing Microcomponents

Maksim Shpak, P. Kärhä, M. Ojanen, E Ikonen, Martti Heinonen

Research output: Contribution to journalArticleScientificpeer-review

Original languageEnglish
Pages (from-to)1762-1770
JournalINTERNATIONAL JOURNAL OF THERMOPHYSICS
Volume31
Issue number8-9
Publication statusPublished - 2010
MoE publication typeA1 Journal article-refereed

Keywords

  • emissivity modelling
  • refractive index
  • silicon
  • temperature

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