Optical properties of silicon nanocrystals in silica: Results of cutoff, m-line, and X- ray photoelectron spectroscopy

Leonid Khriachtchev; T. Nikitin; C.J. Oton; R. Velagapudi; J. Sainio; J. Lahtinen; S. Novikov

doi:10.1063/1.3010304

Optical properties of silicon nanocrystals in silica: Results of cutoff, m-line, and X- ray photoelectron spectroscopy

Leonid Khriachtchev, T. Nikitin, C.J. Oton, R. Velagapudi, J. Sainio, J. Lahtinen, S. Novikov

Research output: Contribution to journal › Article › Scientific › peer-review

Original language	English
Journal	Journal of Applied Physics
Volume	104
DOIs	https://doi.org/10.1063/1.3010304
Publication status	Published - 2008
MoE publication type	A1 Journal article-refereed

Keywords

nanocrystals
silicon
XPS

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10.1063/1.3010304

Cite this

@article{26639aab2c4f4c648fe7a1d9e7754082,

title = "Optical properties of silicon nanocrystals in silica: Results of cutoff, m-line, and X- ray photoelectron spectroscopy",

keywords = "nanocrystals, silicon, XPS, nanocrystals, silicon, XPS, nanocrystals, silicon, XPS",

author = "Leonid Khriachtchev and T. Nikitin and C.J. Oton and R. Velagapudi and J. Sainio and J. Lahtinen and S. Novikov",

year = "2008",

doi = "10.1063/1.3010304",

language = "English",

volume = "104",

journal = "Journal of Applied Physics",

issn = "0021-8979",

publisher = "American Institute of Physics",

}

TY - JOUR

T1 - Optical properties of silicon nanocrystals in silica: Results of cutoff, m-line, and X- ray photoelectron spectroscopy

AU - Khriachtchev, Leonid

AU - Nikitin, T.

AU - Oton, C.J.

AU - Velagapudi, R.

AU - Sainio, J.

AU - Lahtinen, J.

AU - Novikov, S.

PY - 2008

Y1 - 2008

KW - nanocrystals

KW - silicon

KW - XPS

KW - nanocrystals

KW - silicon

KW - XPS

KW - nanocrystals

KW - silicon

KW - XPS

UR - http://dx.doi.org/10.1063/1.3010304

U2 - 10.1063/1.3010304

DO - 10.1063/1.3010304

M3 - Article

SN - 0021-8979

VL - 104

JO - Journal of Applied Physics

JF - Journal of Applied Physics

ER -

Optical properties of silicon nanocrystals in silica: Results of cutoff, m-line, and X- ray photoelectron spectroscopy

Keywords

Access to Document

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