Optical properties of silicon nanocrystals in silica: Results of cutoff, m-line, and X- ray photoelectron spectroscopy

L. Khriachtchev, T. Nikitin, C.J. Oton, R. Velagapudi, J. Sainio, J. Lahtinen, S. Novikov

Research output: Contribution to journalArticleScientificpeer-review

Original languageEnglish
JournalJournal of Applied Physics
Volume104
DOIs
Publication statusPublished - 2008
MoE publication typeA1 Journal article-refereed

Keywords

  • nanocrystals
  • silicon
  • XPS

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