Optical characterization of thin films using spectral reflectance and transmittance data at oblique angles of incidence

Farshid Manoocheri, Saulius Nevas, Antti Lamminpää, Erkki Ikonen

Research output: Working paperProfessional

Original languageEnglish
Publication statusPublished - 2005
MoE publication typeD4 Published development or research report or study

Publication series

NameOptics Days 2005, Jyväskylä, Finland, 2005


  • coatings
  • reflection
  • spectrometers and spectrocopic instrumentation
  • transmission

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