Optical characterization of thin films using high-accuracy oblique-incidence transmittance measurements

Saulius Nevas, F. Manoocheri, E. Ikonen, A. Tikhonravov, M. Kokarev, M. Trubetskov

    Research output: Working paperProfessional

    Original languageEnglish
    Place of PublicationEspoo
    Pagespaper PO22
    Publication statusPublished - 2003
    MoE publication typeD4 Published development or research report or study

    Publication series

    NameNorthern Optics 2003, Espoo, June 16-18
    PublisherHelsinki University of Technology

    Keywords

    • optical coatings
    • refractive index

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