Optical characterization of thin films using high-accuracy oblique-incidence transmittance measurements

Saulius Nevas, F. Manoocheri, E. Ikonen, A. Tikhonravov, M. Kokarev, M. Trubetskov

Research output: Working paperProfessional

Original languageEnglish
Place of PublicationEspoo
Pagespaper PO22
Publication statusPublished - 2003
MoE publication typeD4 Published development or research report or study

Publication series

NameNorthern Optics 2003, Espoo, June 16-18
PublisherHelsinki University of Technology

Keywords

  • optical coatings
  • refractive index

Cite this