Optical characterization of directly deposited graphene on a dielectric substrate

Research output: Contribution to journalArticleScientificpeer-review

Researchers

  • Tommi Kaplas
  • Lasse Karvonen
  • Sepehr Ahmadi
  • Babak Amirsolaimani
  • Soroush Mehravar
  • Nasser Peyghambarian
  • Khanh Kieu
  • Seppo Honkanen
  • Harri Lipsanen

  • Yuri Svirko

Research units

  • University of Eastern Finland
  • Technical University of Denmark
  • University of Arizona

Abstract

By using scanning multiphoton microscopy we compare the nonlinear optical properties of the directly deposited and transferred to the dielectric substrate graphene. The direct deposition of graphene on oxidized silicon wafer was done by utilizing sacrificial copper catalyst film. We demonstrate that the directly deposited graphene and bi-layered transferred graphene produce comparable third harmonic signals and have almost the same damage thresholds. Therefore, we believe directly deposited graphene is suitable for the use of e.g. nanofabricated optical setups. (C) 2016 Optical Society of America

Details

Original languageEnglish
Pages (from-to)2965-2970
Number of pages6
JournalOptics Express
Volume24
Issue number3
Publication statusPublished - 8 Feb 2016
MoE publication typeA1 Journal article-refereed

    Research areas

  • CHEMICAL-VAPOR-DEPOSITION, MULTIPHOTON MICROSCOPY, FILMS

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