Open volume defects: positron annihilation spectroscopy

Filip Tuomisto

Research output: Chapter in Book/Report/Conference proceedingChapterScientificpeer-review

6 Citations (Scopus)
Original languageEnglish
Title of host publicationOXIDE SEMICONDUCTORS
EditorsBG Svensson, SJ Pearton, C Jagadish
PublisherElsevier
Pages39-65
Number of pages27
ISBN (Print)978-0-12-396489-2
DOIs
Publication statusPublished - 2013
MoE publication typeA3 Book section, Chapters in research books

Publication series

NameSemiconductors and Semimetals
PublisherElsevier
Volume88
ISSN (Print)0080-8784

Keywords

  • positron annihilation spectroscopy
  • vacancy defects
  • ZnO

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