Open resonator technique for measuring dielectric properties of thin films on a substrate

Sergey N. Dudorov, Dmitri V. Lioubtchenko, Juha A. Mallat, Antti V. Räisänen

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

    Original languageEnglish
    Title of host publicationXXXVIIIth General Assembly of International Radio Science (URSI) 2005, New Delhi, India, October 23-29, 2005
    Place of PublicationNew Delhi, India
    Publication statusPublished - 2005
    MoE publication typeA4 Article in a conference publication


    • open resonator
    • permittivity
    • thin film

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