@article{dd47cacaae1d4c01a5041a409d9b9365,
title = "On the use of total reflection x-ray topography for the observation of misfit dislocation strain at the surface of a Si/Ge-Si heterostructure",
keywords = "dislocations, silicon-germanium, strain, synchrotron x-ray topography, dislocations, silicon-germanium, strain, synchrotron x-ray topography, dislocations, silicon-germanium, strain, synchrotron x-ray topography",
author = "P.J. McNally and G. Dilliway and J.M. Bonar and A. Willoughby and T. Tuomi and R. Rantam{\"a}ki and A.N. Danilewsky and D. Lowney",
year = "2000",
language = "English",
pages = "1644--1646",
journal = "Applied Physics Letters",
issn = "0003-6951",
number = "77",
}