On the effects of temperature on the drop reliability of electronic component boards

Toni T. Mattila, Jue Li, Jorma K. Kivilahti

    Research output: Contribution to journalArticleScientificpeer-review

    15 Citations (Scopus)
    Original languageEnglish
    Pages (from-to)165-179
    JournalMicroelectronics Reliability
    Volume52
    Issue number1
    DOIs
    Publication statusPublished - 2012
    MoE publication typeA1 Journal article-refereed

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