On lateral resolution in x-ray microanalysis

S. Nuortie, L. Palmu, E. Heikinheimo

    Research output: Working paperProfessional

    Original languageEnglish
    Place of PublicationGöteborg
    Publication statusPublished - 1997
    MoE publication typeD4 Published development or research report or study

    Publication series

    NameScandem -97, Göteborg, Sweden, June 10-13, 1997
    PublisherThe Scandinavian Society for electron microscopy

    Keywords

    • lateral resolution
    • microanalysis

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