On-Chip I_DDQ Testability Schemes for Detecting Multiple Faults in CMOS IC's

M. Ismail, C. Hwang, J. DeGroat

    Research output: Contribution to journalArticleScientificpeer-review

    3 Citations (Scopus)
    Original languageEnglish
    Pages (from-to)732-739
    JournalIEEE Journal of Solid-State Circuits
    Volume31
    Issue number5
    Publication statusPublished - 1996
    MoE publication typeA1 Journal article-refereed

    Keywords

    • on-chip, IC, testability, CMOS, detecting, faults

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