@article{0ec0ec12c9da43af86f557ca60aa9bfe,
title = "On-Chip I_DDQ Testability Schemes for Detecting Multiple Faults in CMOS IC's",
keywords = "on-chip, IC, testability, CMOS, detecting, faults, on-chip, IC, testability, CMOS, detecting, faults, on-chip, IC, testability, CMOS, detecting, faults",
author = "M. Ismail and C. Hwang and J. DeGroat",
year = "1996",
language = "English",
volume = "31",
pages = "732--739",
journal = "IEEE Journal of Solid-State Circuits",
issn = "1558-173X",
publisher = "IEEE",
number = "5",
}