On automated co-simulation testing of functional requirements for distributed substation automation systems

Chen Wei Yang, Valeriy Vyatkin

Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

3 Citations (Scopus)

Abstract

The smart grid is positioned as the next generation energy distribution system which incorporates distributed renewable energy and digital communication infrastructure. The Smart Grid is considered by many as a complex Cyber-Physical System, a system with tight integration between its modular cyber and physical processes interacting in a networked environment. Traditionally, the method of testing Smart Grid automation systems is based on device-based testing and this is largely influenced by the bottom-up design methods that are used widely in the engineering of the substation automation system. However, with the advent of the Smart Grid and the introduction of distributed based automation systems, requirement-driven testing of the whole automation system may be more beneficial than device based testing. In this paper, a scripted co-simulation platform is introduced with the purpose of automating the testing of functional requirements in distributed substation automation systems. The scripted co-simulation testing framework is illustrated on a CIGRÉ case study where the distributed automation system is validated against the functional requirements.

Original languageEnglish
Title of host publicationProceedings of the 44th Annual Conference of the IEEE Industrial Electronics Society, IECON 2018
PublisherIEEE
Pages3576-3581
Number of pages6
ISBN (Electronic)9781509066841
DOIs
Publication statusPublished - 26 Dec 2018
MoE publication typeA4 Article in a conference publication
EventAnnual Conference of the IEEE Industrial Electronics Society - Washington, United States
Duration: 21 Oct 201823 Oct 2018
Conference number: 44

Publication series

NameProceedings of the Annual Conference of the IEEE Industrial Electronics Society
PublisherIEEE
ISSN (Print)1553-572X

Conference

ConferenceAnnual Conference of the IEEE Industrial Electronics Society
Abbreviated titleIECON
Country/TerritoryUnited States
CityWashington
Period21/10/201823/10/2018

Keywords

  • Black-box testing
  • Co-simulation
  • CPS
  • IEC 61499
  • IEC 61850
  • Requirement engineering

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