Observing grain boundaries in monolayer molybdenum disulphide by multiphoton microscopy

Lasse Karvonen, Antti Säynätjoki, Babak Amirsolaimani, Shisheng Li, Soroush Mehravar, Nasser Peyghambarian, Harri Lipsanen, Goki Eda, Khanh Kieu, Zhipei Sun

Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

Abstract

Multiphoton microscopy is used to characterize the crystal orientations and grain boundaries of chemical vapor deposited monolayer molybdenum disulphide flakes. Third-harmonic generation is shown to be sensitive for grain boundaries regardless of the crystal mis-orientations.

Original languageEnglish
Title of host publicationNonlinear Optics, NLO 2015
DOIs
Publication statusPublished - 2015
MoE publication typeA4 Article in a conference publication
EventNonlinear Optics - Kauai, United States
Duration: 26 Jul 201531 Jul 2015

Conference

ConferenceNonlinear Optics
Abbreviated titleNLO
CountryUnited States
CityKauai
Period26/07/201531/07/2015

Fingerprint Dive into the research topics of 'Observing grain boundaries in monolayer molybdenum disulphide by multiphoton microscopy'. Together they form a unique fingerprint.

  • Cite this

    Karvonen, L., Säynätjoki, A., Amirsolaimani, B., Li, S., Mehravar, S., Peyghambarian, N., Lipsanen, H., Eda, G., Kieu, K., & Sun, Z. (2015). Observing grain boundaries in monolayer molybdenum disulphide by multiphoton microscopy. In Nonlinear Optics, NLO 2015 [NW3B.1] https://doi.org/10.1364/NLO.2015.NW3B.1