@article{27426ce93a1948558612464bcfe4e143,
title = "Observation of misfit dislocation strain-induced surface features for a Si/Ge-Si heterostructure using total reflection x-ray topography",
keywords = "dislocations, silicon-germanium, strain, synchrotron x-ray topography, dislocations, silicon-germanium, strain, synchrotron x-ray topography, dislocations, silicon-germanium, strain, synchrotron x-ray topography",
author = "P.J. McNally and G. Dilliway and J.M. Bonar and A. Willoughby and T. Tuomi and R. Rantam{\"a}ki and A.N. Danilewsky and D. Lowney",
year = "2000",
language = "English",
pages = "s. R1--R3",
journal = "Physica Status Solidi A",
number = "180",
}