Observation of interface defects in thermally oxidized SiC using positron annihilation

J. Dekker, Kimmo Saarinen, H. Olafsson, E. Sveinbjörnsson

Research output: Contribution to journal › Article › Scientific › peer-review

28 Citations (Scopus)

Keywords

@article{e5d4e263220343b8a2ca15566d103634,

title = "Observation of interface defects in thermally oxidized SiC using positron annihilation",

keywords = "positron, SiC, positron, SiC, positron, SiC",

author = "J. Dekker and Kimmo Saarinen and H. Olafsson and E. Sveinbj{\"o}rnsson",

year = "2003",

language = "English",

volume = "82",

journal = "Applied Physics Letters",

issn = "1077-3118",

publisher = "American Institute of Physics",

}

TY - JOUR

T1 - Observation of interface defects in thermally oxidized SiC using positron annihilation

AU - Dekker, J.

AU - Saarinen, Kimmo

AU - Olafsson, H.

AU - Sveinbjörnsson, E.

PY - 2003

Y1 - 2003

KW - positron

KW - SiC

KW - positron

KW - SiC

KW - positron

KW - SiC

M3 - Article

SN - 1077-3118

VL - 82

JO - Applied Physics Letters

JF - Applied Physics Letters

ER -