Observation of interface defects in thermally oxidized SiC using positron annihilation

J. Dekker, Kimmo Saarinen, H. Olafsson, E. Sveinbjörnsson

Research output: Contribution to journalArticleScientificpeer-review

25 Citations (Scopus)
Original languageEnglish
JournalApplied Physics Letters
Volume82
Publication statusPublished - 2003
MoE publication typeA1 Journal article-refereed

Keywords

  • positron
  • SiC

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