Novel method for error limit determination in x-ray reflectivity analysis

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Novel method for error limit determination in x-ray reflectivity analysis. / Tiilikainen, Jouni; Mattila, Marco; Hakkarainen, Teppo; Lipsanen, Harri.

In: Journal of Physics D: Applied Physics, Vol. 41, No. 11, 115302, 2008, p. 1-8.

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Tiilikainen, Jouni ; Mattila, Marco ; Hakkarainen, Teppo ; Lipsanen, Harri. / Novel method for error limit determination in x-ray reflectivity analysis. In: Journal of Physics D: Applied Physics. 2008 ; Vol. 41, No. 11. pp. 1-8.

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@article{7a7a32fa0d6c4173a47c1085fcbb5eef,
title = "Novel method for error limit determination in x-ray reflectivity analysis",
keywords = "genetic algorithm, x-ray reflectivity, genetic algorithm, x-ray reflectivity, genetic algorithm, x-ray reflectivity",
author = "Jouni Tiilikainen and Marco Mattila and Teppo Hakkarainen and Harri Lipsanen",
year = "2008",
doi = "10.1088/0022-3727/41/11/115302",
language = "English",
volume = "41",
pages = "1--8",
journal = "Journal of Physics D - Applied Physics",
issn = "0022-3727",
number = "11",

}

RIS - Download

TY - JOUR

T1 - Novel method for error limit determination in x-ray reflectivity analysis

AU - Tiilikainen, Jouni

AU - Mattila, Marco

AU - Hakkarainen, Teppo

AU - Lipsanen, Harri

PY - 2008

Y1 - 2008

KW - genetic algorithm

KW - x-ray reflectivity

KW - genetic algorithm

KW - x-ray reflectivity

KW - genetic algorithm

KW - x-ray reflectivity

U2 - 10.1088/0022-3727/41/11/115302

DO - 10.1088/0022-3727/41/11/115302

M3 - Article

VL - 41

SP - 1

EP - 8

JO - Journal of Physics D - Applied Physics

JF - Journal of Physics D - Applied Physics

SN - 0022-3727

IS - 11

M1 - 115302

ER -

ID: 3409874