Novel method for analysing signal errors caused by polygonal approximations in the fabrication of diffractive elements

I. Kallioniemi; J. Saarinen; K. Blomstedt; J. Turunen

Novel method for analysing signal errors caused by polygonal approximations in the fabrication of diffractive elements

I. Kallioniemi
, J. Saarinen
, K. Blomstedt
, J. Turunen

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review

Original language	English
Title of host publication	Micro-optical Technologies for Measurement, Sensors, and Microsystems II, München, Saksa, 18.6-20.6.1997
Editors	O. M. Parriaux, E.-B. Kley, B. Culshaw, M. Breidne
Place of Publication	Washington
Publisher	SPIE
Pages	223-230
Publication status	Published - 1997
MoE publication type	A4 Conference publication

Keywords

diffractive optics
polygon coding
scalar diffraction
signal errors

Cite this

Kallioniemi, I., Saarinen, J., Blomstedt, K., & Turunen, J. (1997). Novel method for analysing signal errors caused by polygonal approximations in the fabrication of diffractive elements. In O. M. Parriaux, E.-B. Kley, B. Culshaw, & M. Breidne (Eds.), Micro-optical Technologies for Measurement, Sensors, and Microsystems II, München, Saksa, 18.6-20.6.1997 (pp. 223-230). SPIE.

Kallioniemi, I. ; Saarinen, J. ; Blomstedt, K. et al. / Novel method for analysing signal errors caused by polygonal approximations in the fabrication of diffractive elements. Micro-optical Technologies for Measurement, Sensors, and Microsystems II, München, Saksa, 18.6-20.6.1997. editor / O. M. Parriaux ; E.-B. Kley ; B. Culshaw ; M. Breidne. Washington : SPIE, 1997. pp. 223-230

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title = "Novel method for analysing signal errors caused by polygonal approximations in the fabrication of diffractive elements",

keywords = "diffractive optics, polygon coding, scalar diffraction, signal errors, diffractive optics, polygon coding, scalar diffraction, signal errors, diffractive optics, polygon coding, scalar diffraction, signal errors",

author = "I. Kallioniemi and J. Saarinen and K. Blomstedt and J. Turunen",

year = "1997",

language = "English",

pages = "223--230",

editor = "Parriaux, \{O. M.\} and E.-B. Kley and B. Culshaw and M. Breidne",

booktitle = "Micro-optical Technologies for Measurement, Sensors, and Microsystems II, M{\"u}nchen, Saksa, 18.6-20.6.1997",

publisher = "SPIE",

address = "United States",

}

Kallioniemi, I, Saarinen, J, Blomstedt, K & Turunen, J 1997, Novel method for analysing signal errors caused by polygonal approximations in the fabrication of diffractive elements. in OM Parriaux, E-B Kley, B Culshaw & M Breidne (eds), Micro-optical Technologies for Measurement, Sensors, and Microsystems II, München, Saksa, 18.6-20.6.1997. SPIE, Washington, pp. 223-230.

Novel method for analysing signal errors caused by polygonal approximations in the fabrication of diffractive elements. / Kallioniemi, I.; Saarinen, J.; Blomstedt, K. et al.
Micro-optical Technologies for Measurement, Sensors, and Microsystems II, München, Saksa, 18.6-20.6.1997. ed. / O. M. Parriaux; E.-B. Kley; B. Culshaw; M. Breidne. Washington: SPIE, 1997. p. 223-230.

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review

TY - GEN

T1 - Novel method for analysing signal errors caused by polygonal approximations in the fabrication of diffractive elements

AU - Kallioniemi, I.

AU - Saarinen, J.

AU - Blomstedt, K.

AU - Turunen, J.

PY - 1997

Y1 - 1997

KW - diffractive optics

KW - polygon coding

KW - scalar diffraction

KW - signal errors

KW - diffractive optics

KW - polygon coding

KW - scalar diffraction

KW - signal errors

KW - diffractive optics

KW - polygon coding

KW - scalar diffraction

KW - signal errors

M3 - Conference article in proceedings

SP - 223

EP - 230

BT - Micro-optical Technologies for Measurement, Sensors, and Microsystems II, München, Saksa, 18.6-20.6.1997

A2 - Parriaux, O. M.

A2 - Kley, E.-B.

A2 - Culshaw, B.

A2 - Breidne, M.

PB - SPIE

CY - Washington

ER -