Novel Large-Area High-Resolution-Transmission-Electron-Microscopy Technique using Specimens Fabricated by a Focused Ion Beam Appratus

H. Suematsu, K. Udo, K. Hitsatsune, K. Yatsui, H. Yamauchi, Maarit Karppinen

    Research output: Contribution to journalArticleScientificpeer-review

    Original languageEnglish
    Pages (from-to)1100-1103
    JournalJapanese Journal of Applied Physics
    Volume40
    Publication statusPublished - 2001
    MoE publication typeA1 Journal article-refereed

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