Nonlinear thermovoltage in a single-electron transistor

J. T. Peltonen, P. A. Erdman, B. Bhandari, B. Dutta, H. Courtois, R. Fazio, F. Taddei, J. P. Pekola

Research output: Contribution to journalArticleScientificpeer-review

5 Citations (Scopus)
217 Downloads (Pure)

Abstract

We perform direct thermovoltage measurements in a single-electron transistor, using on-chip local thermometers, in both the linear and nonlinear regimes. Using a model which accounts for cotunneling, we find excellent agreement with the experimental data with no free parameters even when the temperature difference is larger than the average temperature (far-from-linear regime). This allows us to confirm the sensitivity of the thermovoltage on cotunneling and to find that in the nonlinear regime the temperature of the metallic island is a crucial parameter. Surprisingly, the metallic island tends to overheat even at zero net charge current, resulting in a reduction of the thermovoltage.

Original languageEnglish
Article number165405
Pages (from-to)1-8
JournalPhysical Review B
Volume99
Issue number16
DOIs
Publication statusPublished - 2 Apr 2019
MoE publication typeA1 Journal article-refereed

Fingerprint Dive into the research topics of 'Nonlinear thermovoltage in a single-electron transistor'. Together they form a unique fingerprint.

Cite this