TY - JOUR
T1 - Nonlinear microscopy using cylindrical vector beams
T2 - Applications to three-dimensional imaging of nanostructures
AU - Bautista, Godofredo
AU - Kakko, Joona Pekko
AU - Dhaka, Veer
AU - Zang, Xiaorun
AU - Karvonen, Lasse
AU - Jiang, Hua
AU - Kauppinen, Esko
AU - Lipsanen, Harri
AU - Kauranen, Martti
PY - 2017/5/29
Y1 - 2017/5/29
N2 - The three-dimensional (3D) optical fields that arise from the focusing of cylindrical vector beams (CVB) with radial and azimuthal polarizations provide new sources of contrast for optical microscopy of nano-objects. So far, these demonstrations have been restricted to two-dimensional transversal scanning, i.e., along the focal plane of interest, or use of point-like objects, i.e., single molecules and nanoparticles. Here, we demonstrate the first application of CVBs for 3D imaging of 3D nano-objects. This technique is done by acquiring 3D image scans of the second-harmonic generation signal from vertically-aligned semiconductor nanowires, whose second-order response is primarily driven by the longitudinal electric field, i.e., the field component along the nanowire axis. Our technique provides a new way to study individual nano-objects in three dimensions through the unique combination of nonlinear microscopy and CVBs.
AB - The three-dimensional (3D) optical fields that arise from the focusing of cylindrical vector beams (CVB) with radial and azimuthal polarizations provide new sources of contrast for optical microscopy of nano-objects. So far, these demonstrations have been restricted to two-dimensional transversal scanning, i.e., along the focal plane of interest, or use of point-like objects, i.e., single molecules and nanoparticles. Here, we demonstrate the first application of CVBs for 3D imaging of 3D nano-objects. This technique is done by acquiring 3D image scans of the second-harmonic generation signal from vertically-aligned semiconductor nanowires, whose second-order response is primarily driven by the longitudinal electric field, i.e., the field component along the nanowire axis. Our technique provides a new way to study individual nano-objects in three dimensions through the unique combination of nonlinear microscopy and CVBs.
UR - http://www.scopus.com/inward/record.url?scp=85020040243&partnerID=8YFLogxK
U2 - 10.1364/OE.25.012463
DO - 10.1364/OE.25.012463
M3 - Article
AN - SCOPUS:85020040243
VL - 25
SP - 12463
EP - 12468
JO - Optics Express
JF - Optics Express
SN - 1094-4087
IS - 11
ER -