Nonlinear microscopy using cylindrical vector beams: Applications to three-dimensional imaging of nanostructures

Godofredo Bautista*, Joona Pekko Kakko, Veer Dhaka, Xiaorun Zang, Lasse Karvonen, Hua Jiang, Esko Kauppinen, Harri Lipsanen, Martti Kauranen

*Corresponding author for this work

Research output: Contribution to journalArticleScientificpeer-review

19 Citations (Scopus)
84 Downloads (Pure)

Abstract

The three-dimensional (3D) optical fields that arise from the focusing of cylindrical vector beams (CVB) with radial and azimuthal polarizations provide new sources of contrast for optical microscopy of nano-objects. So far, these demonstrations have been restricted to two-dimensional transversal scanning, i.e., along the focal plane of interest, or use of point-like objects, i.e., single molecules and nanoparticles. Here, we demonstrate the first application of CVBs for 3D imaging of 3D nano-objects. This technique is done by acquiring 3D image scans of the second-harmonic generation signal from vertically-aligned semiconductor nanowires, whose second-order response is primarily driven by the longitudinal electric field, i.e., the field component along the nanowire axis. Our technique provides a new way to study individual nano-objects in three dimensions through the unique combination of nonlinear microscopy and CVBs.

Original languageEnglish
Pages (from-to)12463-12468
Number of pages6
JournalOptics Express
Volume25
Issue number11
DOIs
Publication statusPublished - 29 May 2017
MoE publication typeA1 Journal article-refereed

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