Nonlinear microscopy of nano-objects using excitation beam profiles with engineered phase jumps

Research output: Chapter in Book/Report/Conference proceedingConference contributionScientific

Standard

Nonlinear microscopy of nano-objects using excitation beam profiles with engineered phase jumps. / Turquet, L.; Kakko, J. P.; Karvonen, Lasse; Jiang, H.; Isotalo, T. J.; Huhtio, T.; Niemi, T.; Kauppinen, E.; Lipsanen, H.; Kauranen, M.; Bautista, G.

2016 Conference on Lasers and Electro-Optics, CLEO 2016. Institute of Electrical and Electronics Engineers, 2016. 7787710 (Conference on Lasers and Electro-Optics).

Research output: Chapter in Book/Report/Conference proceedingConference contributionScientific

Harvard

Turquet, L, Kakko, JP, Karvonen, L, Jiang, H, Isotalo, TJ, Huhtio, T, Niemi, T, Kauppinen, E, Lipsanen, H, Kauranen, M & Bautista, G 2016, Nonlinear microscopy of nano-objects using excitation beam profiles with engineered phase jumps. in 2016 Conference on Lasers and Electro-Optics, CLEO 2016., 7787710, Conference on Lasers and Electro-Optics, Institute of Electrical and Electronics Engineers, Conference on Lasers and Electro-Optics, San Jose, United States, 05/06/2016. https://doi.org/10.1364/CLEO_QELS.2016.FTh3A.6

APA

Turquet, L., Kakko, J. P., Karvonen, L., Jiang, H., Isotalo, T. J., Huhtio, T., ... Bautista, G. (2016). Nonlinear microscopy of nano-objects using excitation beam profiles with engineered phase jumps. In 2016 Conference on Lasers and Electro-Optics, CLEO 2016 [7787710] (Conference on Lasers and Electro-Optics). Institute of Electrical and Electronics Engineers. https://doi.org/10.1364/CLEO_QELS.2016.FTh3A.6

Vancouver

Turquet L, Kakko JP, Karvonen L, Jiang H, Isotalo TJ, Huhtio T et al. Nonlinear microscopy of nano-objects using excitation beam profiles with engineered phase jumps. In 2016 Conference on Lasers and Electro-Optics, CLEO 2016. Institute of Electrical and Electronics Engineers. 2016. 7787710. (Conference on Lasers and Electro-Optics). https://doi.org/10.1364/CLEO_QELS.2016.FTh3A.6

Author

Turquet, L. ; Kakko, J. P. ; Karvonen, Lasse ; Jiang, H. ; Isotalo, T. J. ; Huhtio, T. ; Niemi, T. ; Kauppinen, E. ; Lipsanen, H. ; Kauranen, M. ; Bautista, G. / Nonlinear microscopy of nano-objects using excitation beam profiles with engineered phase jumps. 2016 Conference on Lasers and Electro-Optics, CLEO 2016. Institute of Electrical and Electronics Engineers, 2016. (Conference on Lasers and Electro-Optics).

Bibtex - Download

@inproceedings{c17e8961ac9f4cf9ac502355dd715960,
title = "Nonlinear microscopy of nano-objects using excitation beam profiles with engineered phase jumps",
abstract = "We introduce nonlinear microscopy with phase-engineered incident beams. By controlling the phase across an incident Hermite-Gaussian HG10 beam, we vary the longitudinal electric field component at focus, allowing tailoring of second-harmonic generation from vertically-oriented nanowires.",
author = "L. Turquet and Kakko, {J. P.} and Lasse Karvonen and H. Jiang and Isotalo, {T. J.} and T. Huhtio and T. Niemi and E. Kauppinen and H. Lipsanen and M. Kauranen and G. Bautista",
year = "2016",
month = "12",
day = "16",
doi = "10.1364/CLEO_QELS.2016.FTh3A.6",
language = "English",
series = "Conference on Lasers and Electro-Optics",
publisher = "Institute of Electrical and Electronics Engineers",
booktitle = "2016 Conference on Lasers and Electro-Optics, CLEO 2016",
address = "United States",

}

RIS - Download

TY - GEN

T1 - Nonlinear microscopy of nano-objects using excitation beam profiles with engineered phase jumps

AU - Turquet, L.

AU - Kakko, J. P.

AU - Karvonen, Lasse

AU - Jiang, H.

AU - Isotalo, T. J.

AU - Huhtio, T.

AU - Niemi, T.

AU - Kauppinen, E.

AU - Lipsanen, H.

AU - Kauranen, M.

AU - Bautista, G.

PY - 2016/12/16

Y1 - 2016/12/16

N2 - We introduce nonlinear microscopy with phase-engineered incident beams. By controlling the phase across an incident Hermite-Gaussian HG10 beam, we vary the longitudinal electric field component at focus, allowing tailoring of second-harmonic generation from vertically-oriented nanowires.

AB - We introduce nonlinear microscopy with phase-engineered incident beams. By controlling the phase across an incident Hermite-Gaussian HG10 beam, we vary the longitudinal electric field component at focus, allowing tailoring of second-harmonic generation from vertically-oriented nanowires.

UR - http://www.scopus.com/inward/record.url?scp=85010653999&partnerID=8YFLogxK

U2 - 10.1364/CLEO_QELS.2016.FTh3A.6

DO - 10.1364/CLEO_QELS.2016.FTh3A.6

M3 - Conference contribution

T3 - Conference on Lasers and Electro-Optics

BT - 2016 Conference on Lasers and Electro-Optics, CLEO 2016

PB - Institute of Electrical and Electronics Engineers

ER -

ID: 10796181