Nonlinear microscopy of nano-objects using excitation beam profiles with engineered phase jumps

Research output: Chapter in Book/Report/Conference proceedingConference contributionScientific

Researchers

Research units

  • Tampere University of Technology

Abstract

We introduce nonlinear microscopy with phase-engineered incident beams. By controlling the phase across an incident Hermite-Gaussian HG10 beam, we vary the longitudinal electric field component at focus, allowing tailoring of second-harmonic generation from vertically-oriented nanowires.

Details

Original languageEnglish
Title of host publication2016 Conference on Lasers and Electro-Optics, CLEO 2016
Publication statusPublished - 16 Dec 2016
MoE publication typeB3 Non-refereed article in conference proceedings
EventConference on Lasers and Electro-Optics - San Jose, United States
Duration: 5 Jun 201610 Jun 2016

Publication series

NameConference on Lasers and Electro-Optics
ISSN (Print)2160-9020

Conference

ConferenceConference on Lasers and Electro-Optics
Abbreviated titleCLEO
CountryUnited States
CitySan Jose
Period05/06/201610/06/2016

ID: 10796181