Nonlinear microscopy of nano-objects using excitation beam profiles with engineered phase jumps

L. Turquet, J. P. Kakko, Lasse Karvonen, H. Jiang, T. J. Isotalo, T. Huhtio, T. Niemi, E. Kauppinen, H. Lipsanen, M. Kauranen, G. Bautista

Research output: Chapter in Book/Report/Conference proceedingConference contributionScientific

Abstract

We introduce nonlinear microscopy with phase-engineered incident beams. By controlling the phase across an incident Hermite-Gaussian HG10 beam, we vary the longitudinal electric field component at focus, allowing tailoring of second-harmonic generation from vertically-oriented nanowires.

Original languageEnglish
Title of host publication2016 Conference on Lasers and Electro-Optics, CLEO 2016
PublisherIEEE
Number of pages2
ISBN (Electronic)9781943580118
DOIs
Publication statusPublished - 16 Dec 2016
MoE publication typeB3 Non-refereed article in conference proceedings
EventConference on Lasers and Electro-Optics - San Jose, United States
Duration: 5 Jun 201610 Jun 2016

Publication series

NameConference on Lasers and Electro-Optics
ISSN (Print)2160-9020

Conference

ConferenceConference on Lasers and Electro-Optics
Abbreviated titleCLEO
CountryUnited States
CitySan Jose
Period05/06/201610/06/2016

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  • Cite this

    Turquet, L., Kakko, J. P., Karvonen, L., Jiang, H., Isotalo, T. J., Huhtio, T., ... Bautista, G. (2016). Nonlinear microscopy of nano-objects using excitation beam profiles with engineered phase jumps. In 2016 Conference on Lasers and Electro-Optics, CLEO 2016 [7787710] (Conference on Lasers and Electro-Optics). IEEE. https://doi.org/10.1364/CLEO_QELS.2016.FTh3A.6