Noise insights into electronic transport

Research output: Contribution to journalArticleScientificpeer-review

Researchers

  • S. U. Piatrusha
  • L. V. Ginzburg
  • E. S. Tikhonov
  • D. V. Shovkun
  • G. Koblmüller
  • A. V. Bubis
  • A. K. Grebenko
  • Albert Nasibulin

  • V. S. Khrapai

Research units

  • RAS - Institute of Solid State Physics
  • Moscow Institute of Physics and Technology
  • Technical University of Munich
  • Skolkovo Institute of Science and Technology
  • Lomonosov Moscow State University

Abstract

Typical experimental measurement is set up as a study of the system’s response to a stationary external excitation. This approach considers any random fluctuation of the signal as spurious contribution, which is to be eliminated via time-averaging, or, equivalently, bandwidth reduction. Beyond that lies a conceptually different paradigm—the measurement of the system’s spontaneous fluctuations. The goal of this overview article is to demonstrate how current noise measurements bring insight into hidden features of electronic transport in various mesoscopic conductors, ranging from 2D topological insulators to individual carbon nanotubes.

Details

Original languageEnglish
Pages (from-to)71–83
JournalJETP Letters
Volume108
Issue number1
Publication statusPublished - Jul 2018
MoE publication typeA1 Journal article-refereed

ID: 26483705