Noise insights into electronic transport

S. U. Piatrusha, L. V. Ginzburg, E. S. Tikhonov, D. V. Shovkun, G. Koblmüller, A. V. Bubis, A. K. Grebenko, A. G. Nasibulin, V. S. Khrapai*

*Corresponding author for this work

Research output: Contribution to journalArticleScientificpeer-review

5 Citations (Scopus)

Abstract

Typical experimental measurement is set up as a study of the system’s response to a stationary external excitation. This approach considers any random fluctuation of the signal as spurious contribution, which is to be eliminated via time-averaging, or, equivalently, bandwidth reduction. Beyond that lies a conceptually different paradigm—the measurement of the system’s spontaneous fluctuations. The goal of this overview article is to demonstrate how current noise measurements bring insight into hidden features of electronic transport in various mesoscopic conductors, ranging from 2D topological insulators to individual carbon nanotubes.

Original languageEnglish
Pages (from-to)71–83
JournalJETP Letters
Volume108
Issue number1
DOIs
Publication statusPublished - Jul 2018
MoE publication typeA1 Journal article-refereed

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