Noise insights into electronic transport

S. U. Piatrusha; L. V. Ginzburg; E. S. Tikhonov; D. V. Shovkun; G. Koblmüller; A. V. Bubis; A. K. Grebenko; A. G. Nasibulin; V. S. Khrapai

doi:10.1134/S0021364018130039

Noise insights into electronic transport

S. U. Piatrusha, L. V. Ginzburg, E. S. Tikhonov, D. V. Shovkun, G. Koblmüller, A. V. Bubis, A. K. Grebenko, A. G. Nasibulin, V. S. Khrapai^*

^*Corresponding author for this work

Department of Applied Physics

Research output: Contribution to journal › Article › Scientific › peer-review

7 Citations (Scopus)

Abstract

Typical experimental measurement is set up as a study of the system’s response to a stationary external excitation. This approach considers any random fluctuation of the signal as spurious contribution, which is to be eliminated via time-averaging, or, equivalently, bandwidth reduction. Beyond that lies a conceptually different paradigm—the measurement of the system’s spontaneous fluctuations. The goal of this overview article is to demonstrate how current noise measurements bring insight into hidden features of electronic transport in various mesoscopic conductors, ranging from 2D topological insulators to individual carbon nanotubes.

Original language	English
Pages (from-to)	71–83
Journal	JETP Letters
Volume	108
Issue number	1
DOIs	https://doi.org/10.1134/S0021364018130039
Publication status	Published - Jul 2018
MoE publication type	A1 Journal article-refereed

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AU - Ginzburg, L. V.

AU - Tikhonov, E. S.

AU - Shovkun, D. V.

AU - Koblmüller, G.

AU - Bubis, A. V.

AU - Grebenko, A. K.

AU - Nasibulin, A. G.

AU - Khrapai, V. S.

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Noise insights into electronic transport

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