Abstract
Typical experimental measurement is set up as a study of the system’s response to a stationary external excitation. This approach considers any random fluctuation of the signal as spurious contribution, which is to be eliminated via time-averaging, or, equivalently, bandwidth reduction. Beyond that lies a conceptually different paradigm—the measurement of the system’s spontaneous fluctuations. The goal of this overview article is to demonstrate how current noise measurements bring insight into hidden features of electronic transport in various mesoscopic conductors, ranging from 2D topological insulators to individual carbon nanotubes.
Original language | English |
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Pages (from-to) | 71–83 |
Journal | JETP Letters |
Volume | 108 |
Issue number | 1 |
DOIs | |
Publication status | Published - Jul 2018 |
MoE publication type | A1 Journal article-refereed |