New verification routine for pulsed I-V and transient current measurement setup applied to a THz Schottky diode

Subash Khanal, Tero Kiuru, Juha Mallat, Antti V. Räisänen, Tapani Närhi

Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

3 Citations (Scopus)
Original languageEnglish
Title of host publication43rd European Microwave Conference (EuMW 2013), Nuremberg, Germany, October 6-11, 2013
Place of PublicationNürnberg, Germany
DOIs
Publication statusPublished - 2013
MoE publication typeA4 Article in a conference publication

Keywords

  • pulsed I-V
  • Schottky diode
  • thermal impedance
  • transient current measurement

Cite this

Khanal, S., Kiuru, T., Mallat, J., Räisänen, A. V., & Närhi, T. (2013). New verification routine for pulsed I-V and transient current measurement setup applied to a THz Schottky diode. In 43rd European Microwave Conference (EuMW 2013), Nuremberg, Germany, October 6-11, 2013 https://doi.org/10.23919/EuMC.2013.6686898