New method for the determination of the defect profile in thin layers grown over a substrate

Research output: Contribution to journalArticleScientificpeer-review

Researchers

  • A. Zubiaga
  • J.A. Garcia
  • F. Plazaola
  • Filip Tuomisto

  • J. Zuniga-Perez
  • V. Munoz-San Jose

Research units

  • University of the Basque Country
  • University of Valencia

Details

Original languageEnglish
Pages (from-to)3973-3976
Number of pages4
JournalPHYSICA STATUS SOLIDI C: CURRENT TOPICS IN SOLID STATE PHYSICS
Volume4
Issue number10
Publication statusPublished - Sep 2007
MoE publication typeA1 Journal article-refereed

    Research areas

  • layer, positron annihilation, ZnO

ID: 3518817