New method for the determination of the defect profile in thin layers grown over a substrate

A. Zubiaga, J.A. Garcia, F. Plazaola, Filip Tuomisto, J. Zuniga-Perez, V. Munoz-San Jose

Research output: Contribution to journalArticleScientificpeer-review

1 Citation (Scopus)
Original languageEnglish
Pages (from-to)3973-3976
Number of pages4
JournalPHYSICA STATUS SOLIDI C: CURRENT TOPICS IN SOLID STATE PHYSICS
Volume4
Issue number10
DOIs
Publication statusPublished - Sep 2007
MoE publication typeA1 Journal article-refereed

Keywords

  • layer
  • positron annihilation
  • ZnO

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