New Five-Standard Calibration Procedures for Network Analyzers and Wafer Probes

    Research output: Working paperProfessional

    Original languageEnglish
    Place of PublicationEspoo
    Pages16
    Publication statusPublished - 1994
    MoE publication typeD4 Published development or research report or study

    Publication series

    NameCircuit Theory Laboratory Report Series
    PublisherHelsinki University of Technology, Circuit Theory Laboratory
    No.CT-19
    ISSN (Print)0784-5979

    Keywords

    • calibration
    • microwave measurements
    • network analyzer
    • scattering parameters

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