New Approach for Thickness Determination of Solution-Deposited Graphene Thin Films

Henri Jussila*, Tom Albrow-Owen, He Yang, Guohua Hu, Sinan Aksimsek, Niko Granqvist, Harri Lipsanen, Richard C.T. Howe, Zhipei Sun, Tawfique Hasan

*Corresponding author for this work

Research output: Contribution to journalArticleScientificpeer-review

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