Neural network-based negative selection algorithm with applications in fault diagnosis

X.T. Gao, Seppo Ovaska, X. Wang

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

    8 Citations (Scopus)
    Original languageEnglish
    Title of host publicationthe IEEE International Conference on Systems, Man, and Cybernetics, The Hague, Neatherlands, October 2004
    Pages3408-3414
    Publication statusPublished - 2004
    MoE publication typeA4 Article in a conference publication

    Keywords

    • artificial immune systems
    • fault diagnosis
    • neural networks

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