Near-Field Optics at Helsinki University of Technology

K. Lindfors, P. Ryytty, T. Setälä, M. Kaivola, C. Aminoff

    Research output: Working paperProfessional

    Original languageEnglish
    Pages25
    Publication statusPublished - 1998
    MoE publication typeD4 Published development or research report or study

    Publication series

    NameFinnish Optics Days 1998, Oulu, 24-25.4.1998

    Keywords

    • diffraction limit
    • near-field optics
    • scanning probe microscopy

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