Mutation analysis vs. code coverage in automated assessment of students' testing skills

Kalle Aaltonen, Petri Ihantola, Otto Seppälä

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

    27 Citations (Scopus)
    Original languageEnglish
    Title of host publicationSPLASH'10 ETS, October 17 - 21, Reno, USA
    Place of PublicationNew York, NY, USA
    PublisherACM
    Pages153-160
    ISBN (Electronic)978-1-4503-0240-1
    DOIs
    Publication statusPublished - 2010
    MoE publication typeA4 Article in a conference publication

    Keywords

    • automated assessment
    • mutation analysis
    • mutation testing
    • programming assignments
    • test coverage

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