MULTIFUNCTIONAL ENTERPRISE READINESS: BEYOND THE POLICY OF BUILD-TEST-FIX CYCLIC REWORK

Kevin N. Otto, Victor Tang*

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

Abstract

NASA, the US Government and many companies attempt to manage the development and launch of new technology using Technology Readiness Levels, TRLs. Unfortunately, TRLs as generally defined are outdated and flawed, based on the extent of prototype or hardware use in the field. Urgency in improving TRL levels drives early release of hardware before it is ready, and initiates cyclic rounds of debugging and fixing failures in the field or laboratory. Such a build-test-fix approach to product development is now well documented to be inefficient and wasteful. We present updated definitions of technology readiness levels (TRLs) based on the lean and design-for-six-sigma product design methodology, a radical departure from the "build-test-fix" methodology of conventional TRLs. We argue that the iterative build-test-fix approach of cyclic rework is costly to product development, as well as, downstream manufacturing and services. We call our updated TRL the L-TRL, for Lean TRL. Consistent with our L-TRL, we also present updated definitions for Manufacturing Readiness Levels (MRLs) to address lean and six-sigma manufacturing principles. Hence we call them L-MRL. We address a void in the literature and unveil definitions for service readiness levels (SRLs).

Original languageEnglish
Title of host publicationPROCEEDINGS OF THE ASME INTERNATIONAL DESIGN ENGINEERING TECHNICAL CONFERENCES AND COMPUTERS AND INFORMATION IN ENGINEERING CONFERENCE, VOL 8, PTS A AND B
PublisherAmerican Society of Mechanical Engineers
Pages1187-1195
Number of pages9
ISBN (Electronic)978-0-7918-3856-3
ISBN (Print)978-0-7918-4905-7
DOIs
Publication statusPublished - 2010
MoE publication typeA4 Article in a conference publication
EventASME International Design Engineering Technical Conferences & Computers and Information in Engineering Conference - San Diego, United States
Duration: 30 Aug 20092 Sep 2009

Conference

ConferenceASME International Design Engineering Technical Conferences & Computers and Information in Engineering Conference
Abbreviated titleIDETC/CIE
Country/TerritoryUnited States
CitySan Diego
Period30/08/200902/09/2009

Keywords

  • TECHNOLOGY
  • DESIGN

Fingerprint

Dive into the research topics of 'MULTIFUNCTIONAL ENTERPRISE READINESS: BEYOND THE POLICY OF BUILD-TEST-FIX CYCLIC REWORK'. Together they form a unique fingerprint.

Cite this