Multidimensional reflectometry for industry (xD-Reflect) an European research project

  • Andreas Höpe
  • , Annette Koo
  • , Francisco M. Verdu
  • , Frédéric B. Leloup
  • , Gaël Obein
  • , Gerd Wübbeler
  • , Joaquín Campos
  • , Paola Iacomussi
  • , Priit Jaanson
  • , Stefan Källberg
  • , Marek Šmíd

    Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

    14 Citations (Scopus)
    238 Downloads (Pure)
    Original languageEnglish
    Title of host publicationMeasuring, Modeling, and Reproducing Material Appearance, San Francisco, California, USA, February 24, 2014
    Place of PublicationSan Francisco, California, USA
    DOIs
    Publication statusPublished - 2014
    MoE publication typeA4 Conference publication

    Publication series

    NameProceedings of SPIE
    Volume9018
    ISSN (Print)0277-786X

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