Moving Beyond p-Type mc-Si: Quantified Measurements of Iron Content and Lifetime of Iron-Rich Precipitates in n-Type Silicon

Ashley E. Morishige, Friedemann D. Heinz, Hannu S. Laine, Jonas Schon, Wolfram Kwapil, Barry Lai, Hele Savin, Martin C. Schubert, Tonio Buonassisi

Research output: Contribution to journalArticleScientificpeer-review

2 Citations (Scopus)

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