Monitoring Industrial Processes Using the Self-Organizing Map

J. Ahola; E. Alhoniemi; O. Simula

Monitoring Industrial Processes Using the Self-Organizing Map

J. Ahola, E. Alhoniemi, O. Simula

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review

Original language	English
Title of host publication	1999 IEEE Midnight-Sun Workshop on Soft Computing Methods in Industrial Applications (SMCia'99), Kuusamo, Finland, June 16-18, 1999
Pages	22-27
Publication status	Published - 1999
MoE publication type	A4 Conference publication

Keywords

data analysis
neural networks
process modeling
system monitoring

Cite this

@inproceedings{408f2def52cb4fd6bbcddb9006c96ca8,

title = "Monitoring Industrial Processes Using the Self-Organizing Map",

keywords = "data analysis, neural networks, process modeling, system monitoring, data analysis, neural networks, process modeling, system monitoring, data analysis, neural networks, process modeling, system monitoring",

author = "J. Ahola and E. Alhoniemi and O. Simula",

year = "1999",

language = "English",

pages = "22--27",

booktitle = "1999 IEEE Midnight-Sun Workshop on Soft Computing Methods in Industrial Applications (SMCia'99), Kuusamo, Finland, June 16-18, 1999",

}

Monitoring Industrial Processes Using the Self-Organizing Map. / Ahola, J.; Alhoniemi, E.; Simula, O.
1999 IEEE Midnight-Sun Workshop on Soft Computing Methods in Industrial Applications (SMCia'99), Kuusamo, Finland, June 16-18, 1999. 1999. p. 22-27.

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review

TY - GEN

T1 - Monitoring Industrial Processes Using the Self-Organizing Map

AU - Ahola, J.

AU - Alhoniemi, E.

AU - Simula, O.

PY - 1999

Y1 - 1999

KW - data analysis

KW - neural networks

KW - process modeling

KW - system monitoring

KW - data analysis

KW - neural networks

KW - process modeling

KW - system monitoring

KW - data analysis

KW - neural networks

KW - process modeling

KW - system monitoring

M3 - Conference article in proceedings

SP - 22

EP - 27

BT - 1999 IEEE Midnight-Sun Workshop on Soft Computing Methods in Industrial Applications (SMCia'99), Kuusamo, Finland, June 16-18, 1999

ER -