Models of image contrast in scanning force microscopy on insulators

A.L. Shluger; A. I. Livshits; A S Foster; C. R A Catlow

doi:10.1088/0953-8984/11/26/201

Models of image contrast in scanning force microscopy on insulators

A.L. Shluger, A. I. Livshits, A S Foster, C. R A Catlow

Not published at Aalto University

Research output: Contribution to journal › Review Article › peer-review

26 Citations (Scopus)

Abstract

We review the results of theoretical modelling of scanning force microscopy and discuss the possibility of obtaining atomic and chemical resolution in contact and non-contact mode SFM, and a related issue of a working model for interpretation of SFM images. As a prototype system we consider the interactions of hard tips with softer alkali halide surfaces in UHV. We briefly review experimental data, then discuss results of static atomistic simulations and molecular dynamical modelling of contact SFM to test some of the assumptions of intuitive SFM models. Then we illustrate the shortcomings of contact SFM by considering an image of a point defect. The mechanism of resolution in non-contact SFM and the effect of avalanche tip-surface adhesion are discussed next. We conclude by discussing the status of SFM with atomic resolution.

Original language	English
Pages (from-to)	R295-R322
Number of pages	28
Journal	Journal of physics: Condensed matter
Volume	11
Issue number	26
DOIs	https://doi.org/10.1088/0953-8984/11/26/201
Publication status	Published - 1999
MoE publication type	A2 Review article, Literature review, Systematic review

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10.1088/0953-8984/11/26/201

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title = "Models of image contrast in scanning force microscopy on insulators",

abstract = "We review the results of theoretical modelling of scanning force microscopy and discuss the possibility of obtaining atomic and chemical resolution in contact and non-contact mode SFM, and a related issue of a working model for interpretation of SFM images. As a prototype system we consider the interactions of hard tips with softer alkali halide surfaces in UHV. We briefly review experimental data, then discuss results of static atomistic simulations and molecular dynamical modelling of contact SFM to test some of the assumptions of intuitive SFM models. Then we illustrate the shortcomings of contact SFM by considering an image of a point defect. The mechanism of resolution in non-contact SFM and the effect of avalanche tip-surface adhesion are discussed next. We conclude by discussing the status of SFM with atomic resolution.",

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AU - Shluger, A.L.

AU - Livshits, A. I.

AU - Foster, A S

AU - Catlow, C. R A

PY - 1999

Y1 - 1999

N2 - We review the results of theoretical modelling of scanning force microscopy and discuss the possibility of obtaining atomic and chemical resolution in contact and non-contact mode SFM, and a related issue of a working model for interpretation of SFM images. As a prototype system we consider the interactions of hard tips with softer alkali halide surfaces in UHV. We briefly review experimental data, then discuss results of static atomistic simulations and molecular dynamical modelling of contact SFM to test some of the assumptions of intuitive SFM models. Then we illustrate the shortcomings of contact SFM by considering an image of a point defect. The mechanism of resolution in non-contact SFM and the effect of avalanche tip-surface adhesion are discussed next. We conclude by discussing the status of SFM with atomic resolution.

AB - We review the results of theoretical modelling of scanning force microscopy and discuss the possibility of obtaining atomic and chemical resolution in contact and non-contact mode SFM, and a related issue of a working model for interpretation of SFM images. As a prototype system we consider the interactions of hard tips with softer alkali halide surfaces in UHV. We briefly review experimental data, then discuss results of static atomistic simulations and molecular dynamical modelling of contact SFM to test some of the assumptions of intuitive SFM models. Then we illustrate the shortcomings of contact SFM by considering an image of a point defect. The mechanism of resolution in non-contact SFM and the effect of avalanche tip-surface adhesion are discussed next. We conclude by discussing the status of SFM with atomic resolution.

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VL - 11

SP - R295-R322

JO - Journal of physics: Condensed matter

JF - Journal of physics: Condensed matter

IS - 26

ER -

Models of image contrast in scanning force microscopy on insulators

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