Original language | English |
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Journal | Journal of Applied Physics |
Volume | 110 |
Issue number | 4 |
DOIs | |
Publication status | Published - 2011 |
MoE publication type | A1 Journal article-refereed |
Modeling the effect of mobile ion contamination on the stability of a microelectromechanical resonator
Antti Haarahiltunen, Aapo Varpula, Hele Savin
Research output: Contribution to journal › Article › Scientific › peer-review
3
Citations
(Scopus)
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