Model for electroless nickel plating of through holes board process: model accuracy testing

K. Kantola, R. Tenno, H. Koivo

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review

1 Citation (Scopus)

Original language	English
Title of host publication	The Fifth IASTED International Conference on MODELLING, SIMULATION, AND OPTIMIZATION, Oranjestad, Aruba, August 29 - 31, 2005
Editors	G. Tonella
Place of Publication	Oranjestad, Aruba
Publisher	ACTA Press
Pages	6
ISBN (Print)	0-88986-526-4
Publication status	Published - 2005
MoE publication type	A4 Conference publication

Keywords

@inproceedings{66e8bf972f184bdeb77a8def27d2ad84,

title = "Model for electroless nickel plating of through holes board process: model accuracy testing",

keywords = "chemical plating, identification, modelling, chemical plating, identification, modelling, chemical plating, identification, modelling",

author = "K. Kantola and R. Tenno and H. Koivo",

year = "2005",

language = "English",

isbn = "0-88986-526-4",

pages = "6",

editor = "G. Tonella",

booktitle = "The Fifth IASTED International Conference on MODELLING, SIMULATION, AND OPTIMIZATION, Oranjestad, Aruba, August 29 - 31, 2005",

publisher = "ACTA Press",

address = "Canada",

}

Model for electroless nickel plating of through holes board process: model accuracy testing. / Kantola, K.; Tenno, R.; Koivo, H.
The Fifth IASTED International Conference on MODELLING, SIMULATION, AND OPTIMIZATION, Oranjestad, Aruba, August 29 - 31, 2005. ed. / G. Tonella. Oranjestad, Aruba: ACTA Press, 2005. p. 6.

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review

TY - GEN

T1 - Model for electroless nickel plating of through holes board process: model accuracy testing

AU - Kantola, K.

AU - Tenno, R.

AU - Koivo, H.

PY - 2005

Y1 - 2005

KW - chemical plating

KW - identification

KW - modelling

KW - chemical plating

KW - identification

KW - modelling

KW - chemical plating

KW - identification

KW - modelling

M3 - Conference article in proceedings

SN - 0-88986-526-4

SP - 6

BT - The Fifth IASTED International Conference on MODELLING, SIMULATION, AND OPTIMIZATION, Oranjestad, Aruba, August 29 - 31, 2005

A2 - Tonella, G.

PB - ACTA Press

CY - Oranjestad, Aruba

ER -