Mismatch Modeling and Characterization of Bipolar Transistors for Statistical CAD

Mohammed Ismail, H.-Y. To

    Research output: Contribution to journalArticleScientificpeer-review

    Original languageEnglish
    Pages (from-to)608-610
    JournalIEEE Transactions on Circuits and Systems
    Volume43
    Issue number7
    Publication statusPublished - 1996
    MoE publication typeA1 Journal article-refereed

    Keywords

    • mismatch modeling, IC, bipolar, statistical CAD

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