@article{4874ee7c02b5455cacefce8038d4f473,
title = "Misfit dislocations in GaAsN/GaAs interface",
keywords = "dislocations, GaAsN, synchrotron x-ray topography, dislocations, GaAsN, synchrotron x-ray topography, dislocations, GaAsN, synchrotron x-ray topography",
author = "Juha Toivonen and Turkka Tuomi and Juha Riikonen and Lauri Knuuttila and Teppo Hakkarainen and Markku Sopanen and Harri Lipsanen and P.J McNally and W. Chen and D. Lowney",
year = "2003",
month = may,
doi = "10.1023/A:1023999106469",
language = "English",
volume = "14",
pages = "267--270",
journal = "Journal of Materials Science: Materials in Electronics",
issn = "1573-482X",
publisher = "Springer",
number = "5",
}