Misfit dislocations in GaAsN/GaAs interface

Juha Toivonen, Turkka Tuomi, Juha Riikonen, Lauri Knuuttila, Teppo Hakkarainen, Markku Sopanen, Harri Lipsanen, P.J McNally, W. Chen, D. Lowney

    Research output: Contribution to journalArticleScientificpeer-review

    10 Citations (Scopus)
    Original languageEnglish
    Pages (from-to)267-270
    Number of pages4
    JournalJournal of Materials Science: Materials in Electronics
    Volume14
    Issue number5
    DOIs
    Publication statusPublished - May 2003
    MoE publication typeA1 Journal article-refereed

    Keywords

    • dislocations
    • GaAsN
    • synchrotron x-ray topography

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