Millimeter-wave permittivity measurement of thin dielectric film on substrate in the spherical open resonator

Sergey N. Dudorov, Dmitri V. Lioubtchenko, Juha A. Mallat, Antti V. Räisänen

    Research output: Contribution to journalArticleScientificpeer-review

    Original languageEnglish
    Pages (from-to)564-566
    JournalIEEE Microwave and Wireless Components Letters
    Issue number9
    Publication statusPublished - 2005
    MoE publication typeA1 Journal article-refereed


    • dielectric constant
    • millimeter
    • open resonator
    • thin film

    Cite this