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Microwave Noise Measurements on Nanoelectronic Devices
Teemu Elo
Quantum Circuits and Correlations
Department of Applied Physics
Centre of Excellence in Quantum Technology, QTF
Research output
:
Thesis
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Doctoral Thesis
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Collection of Articles
Overview
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Infrastructure
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Dive into the research topics of 'Microwave Noise Measurements on Nanoelectronic Devices'. Together they form a unique fingerprint.
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Engineering
Nanoelectronics
100%
Microwave
100%
Measurement Noise
100%
Amplifier
54%
Correlation
36%
Diffusive
27%
Graphene
27%
Resonator
18%
Experimental Result
18%
Temperature
18%
Shot Noise
18%
Charge Carrier
18%
Circuit Theory
9%
Elements
9%
Semiconductor
9%
Models
9%
Experiments
9%
Receivers
9%
Software Defined Radio
9%
Fluctuations
9%
Two Dimensional
9%
Interference
9%
Characterization Method
9%
Photons
9%
Carrier Density
9%
Single Electron
9%
Frequency Band
9%
Evaporation
9%
Low Noise Amplifier
9%
Noise Source
9%
Measurement System
9%
Electron Optical Lithography
9%
Hot Electron
9%
Samplerate
9%
Amplifier Circuit
9%
Crossover
9%
Physics
Microwave
100%
Noise Measurement
100%
Amplifier
72%
Bandwidth
36%
Correlation
36%
Graphene
27%
Circuits
18%
Value
18%
Noise Temperature
18%
Frequencies
9%
Semiconductor
9%
Geometry
9%
Variations
9%
Broadband
9%
Low Noise
9%
Vacuum
9%
Capacitor
9%
Regimes
9%
Interference
9%
Correction
9%
Electron Beams
9%
Photons
9%
Lithography
9%
Evaporation
9%
Radio Receiver
9%
Chemistry
Noise
100%
Microwave
100%
Correlation
36%
Sample
27%
Graphene
27%
Reaction Temperature
18%
Cryogenics
18%
Aluminum
18%
Charge Carrier
18%
Conductor
18%
Atom
9%
Rate
9%
Density
9%
Elastic Property
9%
Photon
9%
Fluctuation
9%
Semiconductor
9%
Device
9%
Vacuum
9%
Lithography
9%
Electron Transport
9%
Evaporation
9%
Capacitor
9%
Quantum Interference
9%
Liquid Chromatography
9%