Microstructure-based fatigue modelling with residual stresses: Prediction of the fatigue life for various inclusion sizes

Research output: Contribution to journalArticleScientificpeer-review

Researchers

  • Chao Gu
  • Junhe Lian

  • Yanping Bao
  • Qingge Xie
  • Sebastian Münstermann

Research units

  • Massachusetts Institute of Technology
  • University of Science and Technology Beijing
  • RWTH Aachen University

Details

Original languageEnglish
JournalINTERNATIONAL JOURNAL OF FATIGUE
Early online date17 Jun 2019
Publication statusE-pub ahead of print - 17 Jun 2019
MoE publication typeA1 Journal article-refereed

    Research areas

  • Microstructure-sensitive modelling, Residual stress, Defects, Fatigue life, Inclusion size

ID: 34829435