Microdefects in an extremely pure and perfect silicon crystal

T. Tuomi; R. Rantamäki; P.J. McNally; D. Lowney; A.N. Danilewsky; P. Becker

Microdefects in an extremely pure and perfect silicon crystal

T. Tuomi
, R. Rantamäki
, P.J. McNally
, D. Lowney
, A.N. Danilewsky
, P. Becker

Research output: Working paper › Professional

Original language	English
Pages	85
Publication status	Published - 2000
MoE publication type	D4 Published development or research report or study

Publication series

Name	HASYLAB Users' Meeting 2000, Hamburg, Germany, January 28

Keywords

microdefects
silicon
synchrotron
x-ray topography

Cite this

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title = "Microdefects in an extremely pure and perfect silicon crystal",

keywords = "microdefects, silicon, synchrotron, x-ray topography, microdefects, silicon, synchrotron, x-ray topography, microdefects, silicon, synchrotron, x-ray topography",

author = "T. Tuomi and R. Rantam{\"a}ki and P.J. McNally and D. Lowney and A.N. Danilewsky and P. Becker",

year = "2000",

language = "English",

series = "HASYLAB Users' Meeting 2000, Hamburg, Germany, January 28",

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type = "WorkingPaper",

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TY - UNPB

T1 - Microdefects in an extremely pure and perfect silicon crystal

AU - Tuomi, T.

AU - Rantamäki, R.

AU - McNally, P.J.

AU - Lowney, D.

AU - Danilewsky, A.N.

AU - Becker, P.

PY - 2000

Y1 - 2000

KW - microdefects

KW - silicon

KW - synchrotron

KW - x-ray topography

KW - microdefects

KW - silicon

KW - synchrotron

KW - x-ray topography

KW - microdefects

KW - silicon

KW - synchrotron

KW - x-ray topography

M3 - Working paper

T3 - HASYLAB Users' Meeting 2000, Hamburg, Germany, January 28

SP - 85

BT - Microdefects in an extremely pure and perfect silicon crystal

ER -