Microdefects in an extremely pure and perfect silicon crystal

T. Tuomi, R. Rantamäki, P.J. McNally, D. Lowney, A.N. Danilewsky, P. Becker

    Research output: Working paperProfessional

    Original languageEnglish
    Pages85
    Publication statusPublished - 2000
    MoE publication typeD4 Published development or research report or study

    Publication series

    NameHASYLAB Users' Meeting 2000, Hamburg, Germany, January 28

    Keywords

    • microdefects
    • silicon
    • synchrotron
    • x-ray topography

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